XZZ iSocket 16E Delamination Test Frame for iPhone 16E Logic Board Testing

XZZ iSocket 16E Delamination Test Frame Motherboard Layered Test Racks Function Testing for iPhone 16E

The XZZ iSocket 16E Delamination Test Frame is a specialized testing rack designed for function testing of layered iPhone 16E motherboards. It allows technicians to perform stable, efficient delamination and signal verification without full reassembly. Perfect for logic board repair, data recovery, and hardware diagnostics, this tool ensures safe and accurate functionality testing during the iPhone 16E repair process. Widely trusted by mobile phone repair professionals, refurbishing labs, and electronics service centers globally.